کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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703392 | 1460821 | 2006 | 6 صفحه PDF | دانلود رایگان |
Hydrogenated tetrahedral amorphous carbon (ta-C:H) is advantageous as coating material for high-density magnetic and optical storage devices, due to its favorable combination of density and smoothness. An advantage of ta-C:H over tetrahedral amorphous carbon (ta-C) is the absence of macroparticles, often found in cathodic arc deposition of ta-C, and the hydrogen rich surface, compatible with the lubricant. As for ta-C, in order to increase the magnetic storage density, the ta-C:H thickness needs to be decreased. It is thus necessary to determine the minimum thickness for continuous and pin-hole free films. Here we investigate the roughness evolution of ta-C:H by atomic force microscopy and determine the roughness and growth exponents α and β. We find a very similar behaviour to ta-C, with the ta-C:H roughness slightly higher than the ta-C one for any given thickness. This confirms the smoothing effect of impinging ions during ta-C:H deposition.
Journal: Diamond and Related Materials - Volume 15, Issues 4–8, April–August 2006, Pages 898–903