Performance degradation and defect characterization of Ni/4H-SiC Schottky diode neutron detector in high fluence rate neutron irradiation

Performance degradation and defect characterization of Ni/4H-SiC Schottky diode neutron detector in high fluence rate neutron irradiation

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Diamond and Related Materials - Volume 88, September 2018, Pages 256-261

L.Y. Liu, T.L. Shen, A. Liu, T. Zhang, S. Bai, S.R. Xu, P. Jin, Y. Hao, X.P. Ouyang,