کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7178102 | 1467068 | 2015 | 11 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Telephone cord buckles-A relation between wavelength and adhesion
ترجمه فارسی عنوان
باسن کابل طناب - رابطه بین طول موج و چسبندگی
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کلمات کلیدی
فیلم های نازک چسبندگی، خم شدن لایه لایه شدگی، روش عناصر محدود مدل منطقه محصور، تست چسبندگی استرسهای باقی مانده،
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی مکانیک
چکیده انگلیسی
Thin films with low adhesion and large residual stresses may buckle. The resulting morphologies are varied, but one of the most commonly observed is an intriguing oscillating pattern - the so-called “telephone cord” - which has been extensively investigated in the recent years. We have studied the kinematics of formation of telephone cords using a geometrically non-linear plate model and mode dependent interfacial toughness, captured via a cohesive zone. Through extensive Finite Element Simulations, we have demonstrated a simple, non-trivial relation between telephone cord wavelength and interfacial toughness. To validate this prediction, highly stressed Mo thin films were deposited on Si wafers, with a well defined interface and very reproducible adhesion. Studying the morphology of the resulting buckles for different film thicknesses and stresses, we observed a trend which was fully consistent with our simulation results. From the data fit, an adhesion energy of 0.58±0.04 J mâ2 for the SiO2/Ag interface was inferred, which compares well with literature estimates.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of the Mechanics and Physics of Solids - Volume 75, February 2015, Pages 93-103
Journal: Journal of the Mechanics and Physics of Solids - Volume 75, February 2015, Pages 93-103
نویسندگان
Jean-Yvon Faou, Guillaume Parry, Sergey Grachev, Etienne Barthel,