کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7195565 1468228 2015 9 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Reliability demonstration methodology for products with Gamma Process by optimal accelerated degradation testing
ترجمه فارسی عنوان
روش تحلیلی قابلیت اطمینان برای محصولات با فرایند گاما با تست تخریب بهینه شده است
کلمات کلیدی
تظاهرات قابلیت اطمینان، آزمایش تضعیف سریع، تنزل، فرایند گاما، طرح تست مطلوب،
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی مکانیک
چکیده انگلیسی
For products with high reliability and long lifetime, accelerated degradation testing (ADT) may be adopted during product development phase to verify whether its reliability satisfies the predetermined level within feasible test duration. The actual degradation from engineering is usually a strictly monotonic process, such as fatigue crack growth, wear, and erosion. However, the method for reliability demonstration by ADT with monotonic degradation process has not been investigated so far. This paper proposes a reliability demonstration methodology by ADT for this kind of product. We first apply Gamma process to describe the monotonic degradation. Next, we present a reliability demonstration method by converting the required reliability level into allowable cumulative degradation in ADT and comparing the actual accumulative degradation with the allowable level. Further, we suggest an analytical optimal ADT design method for more efficient reliability demonstration by minimizing the asymptotic variance of decision variable in reliability demonstration under the constraints of sample size, test duration, test cost, and predetermined decision risks. The method is validated and illustrated with example on reliability demonstration of alloy product, and is applied to demonstrate the wear reliability within long service duration of spherical plain bearing in the end.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Reliability Engineering & System Safety - Volume 142, October 2015, Pages 369-377
نویسندگان
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