کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
721820 | 892319 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
SCANNING ELECTRON MICROSCOPY BASED MANIPULATION AND CHARACTERISATION OF NANO-SCALE OBJECTS
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مکانیک محاسباتی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: SCANNING ELECTRON MICROSCOPY BASED MANIPULATION AND CHARACTERISATION OF NANO-SCALE OBJECTS SCANNING ELECTRON MICROSCOPY BASED MANIPULATION AND CHARACTERISATION OF NANO-SCALE OBJECTS](/preview/png/721820.png)
چکیده انگلیسی
Two scanning electron microscopy (SEM) based devices for positioning, manipulation and imaging at the nano-scale have been developed. The control and vision system is based on both a commercial scanning probe microscopy (SPM) controller and a client-server approach to ensure that nanopositioning and SEM image processing are executed in real-time. The evaluation of the two devices has been performed by implementing three different applications: (i) attachment of carbon nanotubes on SPM tips, (ii) investigation of mechanical properties of nanowires and (iii) tensile strength measurements for focused electron beam deposits.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: IFAC Proceedings Volumes - Volume 39, Issue 16, 2006, Pages 108–113
Journal: IFAC Proceedings Volumes - Volume 39, Issue 16, 2006, Pages 108–113
نویسندگان
St. Fahlbusch, S. Hoffmann, I. Utke, A. Steinecker, J.-M. Breguet, J. Michler,