کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
721820 892319 2006 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
SCANNING ELECTRON MICROSCOPY BASED MANIPULATION AND CHARACTERISATION OF NANO-SCALE OBJECTS
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مکانیک محاسباتی
پیش نمایش صفحه اول مقاله
SCANNING ELECTRON MICROSCOPY BASED MANIPULATION AND CHARACTERISATION OF NANO-SCALE OBJECTS
چکیده انگلیسی

Two scanning electron microscopy (SEM) based devices for positioning, manipulation and imaging at the nano-scale have been developed. The control and vision system is based on both a commercial scanning probe microscopy (SPM) controller and a client-server approach to ensure that nanopositioning and SEM image processing are executed in real-time. The evaluation of the two devices has been performed by implementing three different applications: (i) attachment of carbon nanotubes on SPM tips, (ii) investigation of mechanical properties of nanowires and (iii) tensile strength measurements for focused electron beam deposits.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: IFAC Proceedings Volumes - Volume 39, Issue 16, 2006, Pages 108–113
نویسندگان
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