Indirect measurement of high grid strip densities over Nyquist sampling rate based on the moiré pattern analysis for quality assurance in grid manufacturing

• Highly precise carbon-interspaced antiscatter grids have been studied.
• Actual grid strip densities over the Nyquist sampling rate are indirectly measured based on the moiré pattern analysis.
• Several grid strip densities in the range of 85–234 lines/in. are investigated.
• The proposed approach is useful for the quality assurance in grid manufacturing.

We have recently developed very precise carbon-interspaced antiscatter grids having a wide range of grid strip densities (i.e., 85–234 lines/in.) by adopting the sawing process, depending on the demands of specific imaging modalities. However, because grid strips of the recently developed grids are mostly invisible through X-ray nondestructive testing due to their high strip densities, quality assurance in the manufacturing has not yet satisfactorily made. In this work, we proposed a pragmatic method to measure actual grid strip densities over the Nyquist sampling rate based on the moiré pattern analysis. We prepared several samples of the carbon-interspaced grids having nominal grid strip densities of 85, 103, 130, 150, 178, 203, 215, and 234 lines/in. and measured their strip densities by using the proposed method to demonstrate its viability assessment. The differences between the nominal and the measured grid strip densities were less than about 1.8%, indicating the proposed method is useful for the quality assurance in grid manufacturing.