کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
730541 892980 2008 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The direct current and microwave resistivities arising from domain wall scattering for Ni and Co films
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
The direct current and microwave resistivities arising from domain wall scattering for Ni and Co films
چکیده انگلیسی

The frequency dependences of surface resistances of ferromagnetic films were measured by a four-point van der Pauw method and a microwave micro-strip method, respectively, to evaluate the direct current (DC) and radio frequency (RF) resistivities arising from domain wall scattering. We observed that the magnetoresistances (MR) in nickel and cobalt films change manifestly as the current conducts from parallel (CIW) to perpendicular (CPW) to the domain walls, which were inspected by a magnetic force microscopy (MFM). The DC resistivity for currents conducting parallel to domain walls (CIW) is significantly smaller than that of the perpendicular (CPW) case. Whereas indistinguishable changes in CIW and CPW conductions were observed for signals increase to microwave frequency where films are configured in T-microstrips.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Measurement - Volume 41, Issue 4, May 2008, Pages 455–462
نویسندگان
, ,