Measuring ionic mobility in mixed-ionic-electronic-conducting nano-dimensioned thin films at near ambient temperatures

In this work, we present a novel and simple method for determining the ionic mobility from the measured I-V relations. It is determined from the position of a peak in the I-V relations and the sweep rate. The mobility so derived is compared with the one obtained by fitting the I-V relations based on solving the drift-diffusion equations for ions and electrons as published recently. Though the near ambient temperature ionic mobility was found to be seven orders of magnitude lower than the corresponding electronic one, it could nevertheless be well deconvoluted and characterized by both methods. The experimental results are compared with previous measurements on bulk and powder samples of molybdenum trioxide.