Exploring microstructural changes associated with oxidation in Ni-YSZ SOFC electrodes using high resolution X-ray computed tomography

► X-ray nano-CT provides a technique for SOFC electrode microstructure characterisation. ► It is non-destructive enabling successful quantification of microstructural evolution. ► Here we demonstrate its application to explore the effects of oxidation on Ni-YSZ electrodes. ► We successfully characterise the growth of porous NiO film during step-wise oxidation. ► The method has wider implications for studies of microstructural change in a range of applications.