کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
781402 1463820 2010 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Electron microscopy analysis for crack propagation behavior of alumina
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی مهندسی مکانیک
پیش نمایش صفحه اول مقاله
Electron microscopy analysis for crack propagation behavior of alumina
چکیده انگلیسی

In order to clarify crack propagation behavior of alumina (α-Al2O3), intergranular and transgranular fractures of alumina were investigated by electron microscopy techniques. For the intergranular fractures cracked grain boundaries were investigated by scanning electron microscopic electron back-scattered diffraction (SEM-EBSD) analysis. It was revealed that the intergranular fracture behavior of polycrystalline alumina with random distribution of crystallographic orientations is independent on grain boundary characters. For the transgranular fractures, fracture surfaces formed in a single-crystalline alumina were observed by electron tomography combined with high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) and high resolution TEM (HR-TEM). Three kinds of fracture surfaces were observed: even fracture surfaces, even fracture surfaces with step-terraces and fracture surfaces composed of the even fracture surface and the curved one. The even fracture surfaces mostly consist of cleavage planes parallel to {11¯02} and {11¯04}. On the other hand, the even fracture surfaces with step-terraces consist of the cleavage planes and basal planes (0 0 0 1). For the fracture surfaces composed of the even fracture surface and the curved one, both the even and curved shapes the even parts were formed by the fine cleavage planes and basal planes, whose intervals were inhomogeneous. It was indicated that the fracture surfaces in alumina are composed of the cleavage planes or basal plane at an atomic scale.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: International Journal of Fatigue - Volume 32, Issue 3, March 2010, Pages 592–598
نویسندگان
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