Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 436, 1 April 2018, Pages 779-784

Maxwell M. Junda, Laxmi Karki Gautam, Robert W. Collins, Nikolas J. Podraza,