کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7893129 | 1509954 | 2018 | 15 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
ToF-SIMS study of oxide films thermally grown on nickel-base alloys
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The oxidation behaviours of polycrystalline and monocrystalline Ni-base alloys (Ni-16Cr-8Fe (wt%)) were investigated in situ by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). The oxide layer formed is duplex: an inner chromium-rich layer and an outer layer which is rich in nickel and iron. Time evolution of the composition of inner layer from pure Cr2O3 towards spinel (NiCr2O4) was observed. The oxidation kinetics was accelerated by alloy grain boundaries, which can favour the diffusion of chromium. Both the parabolic and volatilization constants increased with increasing temperature, with kp varying from 1.9Ã10â3 to 1.6Ã10â2 nm2.sâ1, and kv from 1.0Ã10â3 to 2.9Ã10â3 nm.sâ1.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Corrosion Science - Volume 141, 15 August 2018, Pages 175-181
Journal: Corrosion Science - Volume 141, 15 August 2018, Pages 175-181
نویسندگان
Xiaocui Wu, Svetlana Voyshnis, Antoine Seyeux, Yuriy Chumlyakov, Philippe Marcus,