کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7893129 1509954 2018 15 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
ToF-SIMS study of oxide films thermally grown on nickel-base alloys
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
ToF-SIMS study of oxide films thermally grown on nickel-base alloys
چکیده انگلیسی
The oxidation behaviours of polycrystalline and monocrystalline Ni-base alloys (Ni-16Cr-8Fe (wt%)) were investigated in situ by Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). The oxide layer formed is duplex: an inner chromium-rich layer and an outer layer which is rich in nickel and iron. Time evolution of the composition of inner layer from pure Cr2O3 towards spinel (NiCr2O4) was observed. The oxidation kinetics was accelerated by alloy grain boundaries, which can favour the diffusion of chromium. Both the parabolic and volatilization constants increased with increasing temperature, with kp varying from 1.9×10−3 to 1.6×10−2 nm2.s−1, and kv from 1.0×10−3 to 2.9×10−3 nm.s−1.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Corrosion Science - Volume 141, 15 August 2018, Pages 175-181
نویسندگان
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