An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe

An in situ transmission electron microscopy study of the ion irradiation induced amorphisation of silicon by He and Xe

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Scripta Materialia - Volume 113, 1 March 2016, Pages 190-193

P.D. Edmondson, K.J. Abrams, J.A. Hinks, G. Greaves, C.J. Pawley, I. Hanif, S.E. Donnelly,