Study of density of localized states in Cd4Se96−xSx (x=0, 4, 8, 12) chalcogenide semiconductor

Thin films of Cd4Se96−xSx (x=0, 4, 8, 12) chalcogenide semiconductor were deposited by the thermal evaporation technique on glass substrates. XRD pattern of CdSeS alloys show that the grain size decreases with the concentration of Sulfur (S). The surface morphology changes due to the addition of sulfur content. The effect of sulfur on the DC conductivity has been investigated, which show that the DC conductivity is a thermally activated process. The Mott parameter shows that dominate conduction is in the localized states, also the addition of sulfur in Cd-Se results an increase in electrical conductivity, which may be due to shift of Fermi level. Current-voltage (I-V) measurements at different fixed temperatures show two regions; Ohmic conduction at low bias having a unit slope, and non ohmic conduction at high bias. Observation of the data shows that conduction is dominated by trap limited space charge limited conduction (SCLC), from where the density of state has been calculated using SCLC measurement data. The increase in the density of states with sulfur concentration may be due to the increase in the defect states.