A THz-TDS measurement method for multiple samples

A THz-TDS measurement method is proposed for multiple samples, by which the influence of long-term instabilities can be suppressed on the experimental results. The electric field amplitude of THz wave is recorded one by one for multiple samples at each time delay point, and the THz-TDS of these samples are obtained within one delay-time scanning process. Evident improvement of data reproducibility has been demonstrated by THz-TDS testing experiments. Further, numerical simulation of THz-TDS experiment is performed by the new method and conventional method, in which a periodic fluctuation of THz wave amplitude is assumed. The advantage of the new method is verified for measuring low absorption sample.