Effect of defect size on P-S-N curves in Very-High-Cycle Fatigue

The present paper proposes an innovative approach for the statistical modeling of Probabilistic-S-N (P-S-N) curves in the VHCF regime. The proposed model considers conditional P-S-N curves that depend on a specific value of the initial defect size. From the statistical distribution of the initial defect size, marginal P-S-N curves are estimated and the effect of the risk-volume on the VHCF response is also modeled. Finally, the paper reports a numerical example that quantitatively illustrates the concepts of conditional and marginal P-S-N curves and that shows the effect of the risk-volume on the VHCF response.