کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7970359 1514385 2015 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Transmission electron microscopy study of high-dose iron-implanted sapphire
ترجمه فارسی عنوان
مطالعه میکروسکوپ الکترونی انتقال از یاقوت کبودی با دوز بالای آهن
کلمات کلیدی
سفال ایمپلنت یون میکروسکوپ الکترونی انتقال، همزمان سازی روش نقطه تلاقی متقابل،
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
چکیده انگلیسی
The microstructure of α-Al2O3 implanted with iron at energy of 50 keV to a dose of 1 × 1017 ions/cm2 at room temperature has been studied. The iron concentration profile shows a well-defined peak at ~ 50 nm from the surface, in agreement with the calculated value. The implanted Fe ions precipitate as the α-Fe particles during annealing in a reducing atmosphere. The voids around α-Fe particles and some large iron particles both have faceted outlines. Through the analysis of the composite selected-area electron diffraction pattern (SAED) and Moiré fringes, the orientation relationship (OR) between α-Fe particles and sapphire was determined to be (111)α-Fe//(0001)sapphire and [11¯0]α-Fe//[112¯0]sapphire. Some deviation from this OR was detected in a few α-Fe particles, which is less than 3°. The coincidence of reciprocal lattice point (CRLP) method was utilized to confirm that this OR is preferred in the α-Fe/sapphire system.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Characterization - Volume 102, April 2015, Pages 19-23
نویسندگان
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