کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
7986243 | 1515112 | 2017 | 17 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Intelligent tuning method of PID parameters based on iterative learning control for atomic force microscopy
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Proportional-integral-derivative (PID) parameters play a vital role in the imaging process of an atomic force microscope (AFM). Traditional parameter tuning methods require a lot of manpower and it is difficult to set PID parameters in unattended working environments. In this manuscript, an intelligent tuning method of PID parameters based on iterative learning control is proposed to self-adjust PID parameters of the AFM according to the sample topography. This method gets enough information about the output signals of PID controller and tracking error, which will be used to calculate the proper PID parameters, by repeated line scanning until convergence before normal scanning to learn the topography. Subsequently, the appropriate PID parameters are obtained by fitting method and then applied to the normal scanning process. The feasibility of the method is demonstrated by the convergence analysis. Simulations and experimental results indicate that the proposed method can intelligently tune PID parameters of the AFM for imaging different topographies and thus achieve good tracking performance.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Brought to you by:GAYATRI VIDYA PARISHAD COLLEGE OF ENGINEERING for Women due by 31 Dec 2017
Journal: Micron - Brought to you by:GAYATRI VIDYA PARISHAD COLLEGE OF ENGINEERING for Women due by 31 Dec 2017
نویسندگان
Hui Liu, Yingzi Li, Yingxu Zhang, Yifu Chen, Zihang Song, Zhenyu Wang, Suoxin Zhang, Jianqiang Qian,