کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
7987006 1515170 2013 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
In situ lift-out dedicated techniques using FIB-SEM system for TEM specimen preparation
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد دانش مواد (عمومی)
پیش نمایش صفحه اول مقاله
In situ lift-out dedicated techniques using FIB-SEM system for TEM specimen preparation
چکیده انگلیسی
► An in situ lift-out technique is used to extract foils from across a local grain boundary in bulk Al alloy and from individual Al atomised powder. ► In conjunction with EBSD, the FIB was used for extracting a foil from a dual-phase Ti-Si alloy for the exploration of orientation relationship between constituent phases. ► It is demonstrated that FIB is more applicable for preparing thin foils from hydrogen-sensitive metals.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Micron - Volume 44, January 2013, Pages 115-119
نویسندگان
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