کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8018352 1517236 2015 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
In-situ TEM mechanical testing of nanocrystalline zirconium thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
In-situ TEM mechanical testing of nanocrystalline zirconium thin films
چکیده انگلیسی
Mechanical behavior of nanocrystalline zirconium thin films was investigated in-situ inside a transmission electron microscope (TEM). The yield stress measured for specimens with <10 nm grain size was around 450-500 MPa compared to the bulk value of 250-300 MPa. Similar grain size effects are seen on fracture stress and strain of about 0.9 GPa and 1.5-2% respectively. Using in-situ TEM, we demonstrate control of grain size in the specimens using electro-migration stress and temperature. The experimental results suggest that the critical grain size for inverse Hall-Petch type relationship in nanocrystalline hexagonal close packed metals could be around 15 nm.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Letters - Volume 152, 1 August 2015, Pages 105-108
نویسندگان
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