کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8024372 | 1517546 | 2018 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Surface-enhanced Raman scattering substrates of flat and wrinkly titanium nitride thin films by sputter deposition
ترجمه فارسی عنوان
سطوح پراکندگی رزین رامان از فیلم های نازک تیتانیوم مسطح و چین و چروک توسط رسوب اسپری
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
Titanium nitride (TiN) thin films were prepared by RF magnetron sputtering on a bare Si surface and a silicone-oil-covered Si surface as surface-enhanced Raman scattering (SERS) substrates. The TiN film deposited on the bare Si surface had a flat surface with densely packed grains measuring 18â¯nm in diameter, whereas the TiN film deposited on the oil surface had a wrinkly pattern made of grains measuring 19â¯nm in diameter. To analyze the SERS effect, Rhodamine 6G (R6G) was used as a Raman probe molecule at various concentrations ranging from 10â4 to 10â8â¯M. The analytical enhancement factor (AEF) values at 10â6â¯M R6G were respectively 6.2â¯Ãâ¯103 and 1.3â¯Ãâ¯104 for the flat TiN film and wrinkly TiN film. The SERS effect could be attributed to the enhancement of the local electromagnetic field at the top of the nano-sized grains. The wrinkly TiN film had a higher AEF than the flat TiN film, possibly due to the increased area of the Raman active spots. The wrinkly TiN film exhibited high level of SERS activity and achieved an R6G detection limit of 10â8â¯M.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface and Coatings Technology - Volume 337, 15 March 2018, Pages 434-438
Journal: Surface and Coatings Technology - Volume 337, 15 March 2018, Pages 434-438
نویسندگان
Nahid Kaisar, Yu-Ting Huang, Shyankay Jou, Hung-Fei Kuo, Bohr-Ran Huang, Chung-Chi Chen, Yi-Fang Hsieh, Yueh-Ching Chung,