کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8037639 | 1518286 | 2018 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Advanced microheater for in situ transmission electron microscopy; enabling unexplored analytical studies and extreme spatial stability
ترجمه فارسی عنوان
میکرو هوای پیشرفته برای میکروسکوپ الکترونی انتقال در محل؛ امکان بررسی مطالعات تحلیلی ناشناخته و ثبات فضایی شدید
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
In this work we present our advanced in situ heating sample carrier for transmission electron microscopy (TEM). The TEM is a powerful tool for materials characterization, especially when combined with micro electro-mechanical systems (MEMS). These deliver in situ stimuli such as heating, in which case temperatures up to 1300°C can be reached with high temporal stability without affecting the original TEM spatial resolution: indeed, atomic resolution imaging can be routinely performed. Previously, the thermal expansion of suspended microheaters caused vertical displacement of the sample (bulging). As a result, changing temperatures required either continuous focus or stage adjustments, inducing resolution loss or mechanical drift, respectively. Moreover, those actions hinder the possibility to capture fast dynamic events. This new MEMS-based sample carrier, however, keeps the sample at constant z-position (no bulging) up to 700°C. Furthermore, it enables energy dispersive x-ray spectroscopy (EDS) acquisition in the TEM up to an unmatched temperature of 1000°C, with a drift rate down to 0.1â¯nm/min. Its viewable area of 850 µm2 features a temperature homogeneity up to 99.5%.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 192, September 2018, Pages 14-20
Journal: Ultramicroscopy - Volume 192, September 2018, Pages 14-20
نویسندگان
J. Tijn van Omme, Marina Zakhozheva, Ronald G. Spruit, Mariya Sholkina, H. Hugo Pérez Garza,