Multi-Mode Elastic Peak Electron Microscopy (MM-EPEM): A new imaging technique with an ultimate in-depth resolution for surface analysis

Multi-Mode Elastic Peak Electron Microscopy (MM-EPEM): A new imaging technique with an ultimate in-depth resolution for surface analysis

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 188, May 2018, Pages 13-18

Mohamed Aymen Mahjoub, Guillaume Monier, Luc Bideux, Bernard Gruzza, Christine Robert-Goumet,