کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8037742 1518292 2018 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Sampling limits for electron tomography with sparsity-exploiting reconstructions
ترجمه فارسی عنوان
محدودیت های نمونه برداری برای توموگرافی الکترونی با استفاده از بازسازی های بهره برداری فشرده
کلمات کلیدی
توموگرافی الکترونی سه بعدی، سنجش فشرده، میکروسکوپ الکتریکی انتقال اسکن، الگوریتم بازسازی اسپرتیسثی، توموگرافی کم دوز،
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
Electron tomography (ET) has become a standard technique for 3D characterization of materials at the nano-scale. Traditional reconstruction algorithms such as weighted back projection suffer from disruptive artifacts with insufficient projections. Popularized by compressed sensing, sparsity-exploiting algorithms have been applied to experimental ET data and show promise for improving reconstruction quality or reducing the total beam dose applied to a specimen. Nevertheless, theoretical bounds for these methods have been less explored in the context of ET applications. Here, we perform numerical simulations to investigate performance of ℓ1-norm and total-variation (TV) minimization under various imaging conditions. From 36,100 different simulated structures, our results show specimens with more complex structures generally require more projections for exact reconstruction. However, once sufficient data is acquired, dividing the beam dose over more projections provides no improvements-analogous to the traditional dose-fraction theorem. Moreover, a limited tilt range of ±75° or less can result in distorting artifacts in sparsity-exploiting reconstructions. The influence of optimization parameters on reconstructions is also discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 186, March 2018, Pages 94-103
نویسندگان
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