کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8037873 1518311 2016 12 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Quantitative atomic resolution elemental mapping via absolute-scale energy dispersive X-ray spectroscopy
ترجمه فارسی عنوان
نقشه برداری عنصری کمی از اتم با استفاده از طیف سنجی اشعه ایکس پراکنده انرژی در مقیاس مطلق
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
Quantitative agreement on an absolute scale is demonstrated between experiment and simulation for two-dimensional, atomic-resolution elemental mapping via energy dispersive X-ray spectroscopy. This requires all experimental parameters to be carefully characterized. The agreement is good, but some discrepancies remain. The most likely contributing factors are identified and discussed. Previous predictions that increasing the probe forming aperture helps to suppress the channelling enhancement in the average signal are confirmed experimentally. It is emphasized that simple column-by-column analysis requires a choice of sample thickness that compromises between being thick enough to yield a good signal-to-noise ratio while being thin enough that the overwhelming majority of the EDX signal derives from the column on which the probe is placed, despite strong electron scattering effects.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 168, September 2016, Pages 7-16
نویسندگان
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