کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8037947 1518317 2016 19 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Oxidation-state sensitive imaging of cerium dioxide by atomic-resolution low-angle annular dark field scanning transmission electron microscopy
ترجمه فارسی عنوان
تصویربرداری حساس اکسیداسیون حالت دی اکسید سریم توسط میکروسکوپ الکترونی پرتو اسکرول زاویه حلقه اتم با وضوح اتمی
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
چکیده انگلیسی
Low-angle annular dark field (LAADF) scanning transmission electron microscopy (STEM) imaging is presented as a method that is sensitive to the oxidation state of cerium ions in CeO2 nanoparticles. This relationship was validated through electron energy loss spectroscopy (EELS), in situ measurements, as well as multislice image simulations. Static displacements caused by the increased ionic radius of Ce3+ influence the electron channeling process and increase electron scattering to low angles while reducing scatter to high angles. This process manifests itself by reducing the high-angle annular dark field (HAADF) signal intensity while increasing the LAADF signal intensity in close proximity to Ce3+ ions. This technique can supplement STEM-EELS and in so doing, relax the experimental challenges associated with acquiring oxidation state information at high spatial resolutions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 162, March 2016, Pages 52-60
نویسندگان
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