کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8038390 | 1518342 | 2014 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Effective temperature of an ultracold electron source based on near-threshold photoionization
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
We present a detailed description of measurements of the effective temperature of a pulsed electron source, based on near-threshold photoionization of laser-cooled atoms. The temperature is determined by electron beam waist scans, source size measurements with ion beams, and analysis with an accurate beam line model. Experimental data is presented for the source temperature as a function of the wavelength of the photoionization laser, for both nanosecond and femtosecond ionization pulses. For the nanosecond laser, temperatures as low as 14±3 K were found; for femtosecond photoionization, 30±5 K is possible. With a typical source size of 25μm, this results in electron bunches with a relative transverse coherence length in the 10â4 range and an emittance of a few nm rad.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Ultramicroscopy - Volume 136, January 2014, Pages 73-80
Journal: Ultramicroscopy - Volume 136, January 2014, Pages 73-80
نویسندگان
W.J. Engelen, E.P. Smakman, D.J. Bakker, O.J. Luiten, E.J.D. Vredenbregt,