Probing the probe: AFM tip-profiling via nanotemplates to determine Hamaker constants from phase-distance curves

► Van der Waal forces in tapping mode atomic force microscopy. ► Harmonic approximation model of phase-distance curves probed by simulations. ► Silica tips and surfaces as a model case. ► Tip geometry determined in situ by nanoparticles as nanotemplates. ► Method to derive the Hamaker constant for any tip/surface system.