Diffraction contrast STEM of dislocations: Imaging and simulations

► STEM defect analysis has been extended to include dislocations. ► Systematic row, zone axis & 3g diffraction conditions are all found to be useful for general defect observations in STEM mode. ► Conventional contrast visibility rules for diffraction contrast are found to remain valid for STEM observations. ► Multi-beam dynamical scattering matrix simulations provide excellent agreement with experimental images.