کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8042038 1518700 2014 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Porous structure formation in ion irradiated germanium
ترجمه فارسی عنوان
تشکیل ساختاری متخلخل در ژرمانیوم تابش یون
کلمات کلیدی
ژرمانیوم، تشکیل هویت، لایه متخلخل اشعه یون
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
چکیده انگلیسی
The ion beam induced modification of amorphous germanium is characterised by the formation of voids close to the sample surface and the transformation into a sponge-like porous surface layer at high ion fluences. This extreme structural modification of the sample surface is independent of the (heavy) ion species used and accompanied by a strong volume expansion. Nevertheless, recently it was demonstrated that buried voids (and buried sponge-like layers) can be formed in the depth of the projected ion range, however, only for the irradiation with I-ions at high ion fluences. Thus, the ion species and their chemical properties seem to play an important role in the structural modification around the projected ion range. In this paper we investigate the influence of the ion species on the ion beam induced void formation in Ge for room temperature irradiation with 380 keV I- and Au-ions as a function of the ion fluence. Independent of the ion species, a strong volume expansion is observed caused by void formation and the transformation into a sponge-like porous surface layer. For both ion species used, the final porous layers are structurally identical as established by cross section and plan view electron microscopy investigations. Further ion irradiation of the sponge-like porous structure, however, leads to significant differences in the ion beam induced structural evolution. For the Au-ion irradiation the porous layer remains nearly unchanged, whereas for the irradiation with I-ions a transformation from sponge-like to netlike porous layers occurs which is accompanied again by an extreme volume expansion. The underlying mechanism will be discussed based on chemical properties of the implanted ions.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 319, 15 January 2014, Pages 112-116
نویسندگان
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