کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
8044236 | 1518917 | 2018 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The effect of annealing treatment on microstructure and shape memory behavior of Ti-Ta-Zr thin films
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Ti-Ta-Zr thin films are considered to be promising high-temperature shape memory materials with operation temperature above 100â¯Â°C. The effects of annealing treatment on microstructure and shape memory behavior of Ti-Ta-Zr thin films were investigated. The Ti-Ta-Zr thin films under different annealing conditions were all turned out to be αⳠphase at room temperature while the microstructures were distinct. The shape memory effect increased with the decreasing of annealing temperature with the maximum shape memory recovery rate of 65% after annealing at 550â¯Â°C for 2â¯min. When the grain size is 8â¯nm, shape memory effect disappeared.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 153, July 2018, Pages 1-5
Journal: Vacuum - Volume 153, July 2018, Pages 1-5
نویسندگان
R. Ning, X.H. Zheng, J. Yao, Z.G. Zhang, W. Cai,