Electrostatic potential variation across the surface of a diamond/β-SiC nanocomposite thin film

Electrostatic potential variation across surface of a diamond/β-SiC nanocomposite thin film is obtained using scanning Kelvin probe microscopy. An average electrostatic potential of ∼ −120 mV is measured on the surface (5 × 5 μm2) of the nanocomposite thin film. Using this value and the nominal work function of the probe, the work function values of the constituents could be estimated. In conjunction with secondary electron surface micrograph, the surface potential map features are relevantly assigned to the respective constituents in the nanocomposite thin film.