کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8147129 1524126 2013 21 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Infrared thermography for condition monitoring - A review
ترجمه فارسی عنوان
ترموگرافی مادون قرمز برای نظارت بر وضعیت - بررسی
کلمات کلیدی
ترموگرافی مادون قرمز، نظارت بر وضعیت، تعمیر و نگهداری پیشگیرانه، مانیتورینگ تغییر شکل، ناهنجاری حرارتی، تضمین کیفیت،
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک اتمی و مولکولی و اپتیک
چکیده انگلیسی
Temperature is one of the most common indicators of the structural health of equipment and components. Faulty machineries, corroded electrical connections, damaged material components, etc., can cause abnormal temperature distribution. By now, infrared thermography (IRT) has become a matured and widely accepted condition monitoring tool where the temperature is measured in real time in a non-contact manner. IRT enables early detection of equipment flaws and faulty industrial processes under operating condition thereby, reducing system down time, catastrophic breakdown and maintenance cost. Last three decades witnessed a steady growth in the use of IRT as a condition monitoring technique in civil structures, electrical installations, machineries and equipment, material deformation under various loading conditions, corrosion damages and welding processes. IRT has also found its application in nuclear, aerospace, food, paper, wood and plastic industries. With the advent of newer generations of infrared camera, IRT is becoming a more accurate, reliable and cost effective technique. This review focuses on the advances of IRT as a non-contact and non-invasive condition monitoring tool for machineries, equipment and processes. Various conditions monitoring applications are discussed in details, along with some basics of IRT, experimental procedures and data analysis techniques. Sufficient background information is also provided for the beginners and non-experts for easy understanding of the subject.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Infrared Physics & Technology - Volume 60, September 2013, Pages 35-55
نویسندگان
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