کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
8167316 1526247 2018 14 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Low leakage current Ni/CdZnTe/In diodes for X/γ-ray detectors
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Low leakage current Ni/CdZnTe/In diodes for X/γ-ray detectors
چکیده انگلیسی
The electrical characteristics of the Ni/Cd1−xZnxTe/In structures with a metal-semiconductor rectifying contact are investigated. The diodes, fabricated on the base of In-doped n-type Cd1−xZnxTe (CZT) crystals with resistivity of ∼1010Ω⋅ cm, have low leakage current and can be used as X/γ-ray detectors. The rectifying contact was obtained by vacuum deposition of Ni on the semiconductor surface pretreated with argon plasma. The high barrier rectifying contact allowed us to increase applied reverse bias voltage up to 2500 V at the CZT crystal thickness of 1 mm. Dark (leakage) currents of the diodes with the rectifying contact area of 4 mm2 did not exceed 3-5 nA at bias voltage of 2000 V and room temperature. The charge transport mechanisms in the Ni/CZT/In structures have been interpreted as generation-recombination in the space charge region within the range of reverse bias of 5-100 V and as currents limited by space charge at both forward and reverse bias at V >100 V.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 879, 21 January 2018, Pages 101-105
نویسندگان
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