Determination of L X-ray fluorescence parameters for Ho, Lu, W, Hg and Bi

In this work, L X-ray fluorescence cross sections, L sub-shell fluorescence yields and level widths and radiative vacancy transfer probabilities of L sub-shells to Mi, Ni and Oi sub-shells were measured for the elements Ho, Lu, W, Hg and Bi. Energy dispersive X-ray fluorescence (EDXRF) technique was used to measure L X-ray photons. To obtain related parameters, we used 59.54 keV gamma photons of 241Am radioactive point source. Emitted L X-ray photons from targets were collected by means of a Si(Li) detector with resolution of 180 eV at 5.9 keV. The present results are generally in a good agreement with theoretical calculations and the other results obtained in the literature, within their range considering experimental uncertainty.