کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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848606 | 909247 | 2014 | 4 صفحه PDF | دانلود رایگان |
A series of CdxZn1−xS thin films have been deposited on glass substrates using spray pyrolysis technique. The crystallinity and microstructure of CdxZn1−xS thin films have been investigated by X-ray diffraction (XRD). Based on the results of Hall measurements, the films obtained were an n-type semiconductor. The X-ray data analysis of CdxZn1−xS thin films showed that the grain size of the CdxZn1−xS increased with increase in Cd composition. It is observed that the band gap increases as the Cd composition decreases. The results also showed a blue shift of absorption edge of optical transmission spectra is increases as Zn ratio increases. The effects of Cd composition on the structural and optical properties of CdxZn1−xS thin films were related to their grain size, stress and carrier concentration.
Journal: Optik - International Journal for Light and Electron Optics - Volume 125, Issue 18, September 2014, Pages 5112–5115