کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9566719 1388367 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Morphology of the Si-ZnO interface
موضوعات مرتبط
مهندسی و علوم پایه شیمی شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
Morphology of the Si-ZnO interface
چکیده انگلیسی
For Si-ZnO heterostructures, prepared by magnetron sputtering, the interface morphology is studied by XPS and UPS. ZnO films on Si(1 1 1) surfaces (H-termination and 7 × 7) were prepared by magnetron sputtering and metal organic molecular beam epitaxy (MOMBE) and are investigated in well defined deposition steps and the interface properties were studied in situ. All samples were handled in situ under ultra high vacuum (UHV) conditions. Up to five different interface phases were detected depending on ZnO preparation. Beside a SiOx film induced by the sputter process, ZnO and Zn2SiO4 phases are resolved. In addition hydrogen, appearing as ZnOHx, is found in considerable concentrations in the films.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 4, 15 November 2005, Pages 1139-1146
نویسندگان
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