Micro-structural characterization of laser interference irradiated Ni/Al multi-films

In this work, the micro-structural evolution of irradiated Ni/Al multi-films is analyzed by transmission electron microscopy (TEM) measurements to justify the properties change. The grain size can be obtained to be laterally oscillating between 5 and 10 nm and up to 100 nm and the layer interface to be semicoherent. Up to a certain depth, intermetallic compounds are found in the layer interface.