کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9567025 | 1388382 | 2005 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Low voltage electrodeposition of CNx films and study of the effect of the deposition voltage on bonding configurations
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Carbon nitride (CNx) films were deposited from acetonitrile at low voltage (150-450Â V) through electrodeposition. The films were characterized by atomic force microscopy (AFM), Raman spectroscopy and Fourier transform infrared (FT-IR) spectroscopy. AFM investigations revealed that the grain size was â¼200Â nm and roughness was â¼10Â nm. The films were found to be continuous and close packed. IR spectra revealed existence of strong sp3, sp2 type bonding and weak sp type carbon nitrogen bonds and these bonds were found to increase with voltage. The fraction of sp3-bonded species in the sample increased in low voltage range and after reaching maximum at 350Â V, decreased for higher voltages. However, the concentration of sp2 CN ring structures in the film increased with increasing voltage. Also, the peak width decreased at low voltages reaching a minimum and increased thereafter. It was observed that the voltage dependent increase in the concentration of polymeric type sp2 CN (chain) structures was much more pronounced than that of graphitic type sp2 CN (ring) structures. Raman spectra showed the presence of both the D and G bands. The shift in the G band indicated the presence of nitrogen in the film. The ID/IG ratio was found to increase with the incorporation of nitrogen. Auger electron spectroscopy (AES) showed a clear increase in the nitrogen content with increase in the voltage. The formation of the film could be explained on the basis of dissociation of electrolyte under applied voltage.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Applied Surface Science - Volume 252, Issue 2, 15 October 2005, Pages 321-329
Journal: Applied Surface Science - Volume 252, Issue 2, 15 October 2005, Pages 321-329
نویسندگان
K. Sreejith, J. Nuwad, C.G.S. Pillai,