Keywords: تکنیک های پروب اسکن; Voltammetric techniques; Electrochemical impedance spectroscopy; Electrochemical quartz crystal microbalance; Scanning probe techniques;
مقالات ISI تکنیک های پروب اسکن (ترجمه نشده)
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Keywords: تکنیک های پروب اسکن; Nanotechnology; Diamond probes; Scanning probe techniques; Atomic force microscopy; Nanostructures
PECVD of carbon by inverted fireballs: From sputtering, bias enhanced nucleation to deposition
Keywords: تکنیک های پروب اسکن; PECVD; plasma enhanced chemical vapor deposition; SEM; scanning electron microscope; EDX; energy dispersive X-ray spectroscopy; XRD; X-ray diffraction; XPS; X-ray photoemission spectroscopy; BEN; bias enhanced nucleation; ND; nano-diamond; UNCD; ultra-nan
Ultrathin undoped tetrahedral amorphous carbon films: The role of the underlying titanium layer on the electronic structure
Keywords: تکنیک های پروب اسکن; Tetrahedral amorphous carbon; Role of underlying Ti layer; Role of the Ti/ta-C interface; Filtered cathodic vacuum arc deposition; Raman spectroscopy; Scanning probe techniques; Scanning tunnelling spectroscopy; Conductive-AFM; Conduction mechanism
Approach to an FE simulation of coating damage on bulk metal forming tools
Keywords: تکنیک های پروب اسکن; Coatings; Diamond-like carbon; Mechanical properties; Micro tensile test; Scanning probe techniques; FE simulation
Mixed phase, sp2-sp3 bonded, and disordered few layer graphene-like nanocarbon: Synthesis and characterizations
Keywords: تکنیک های پروب اسکن; Graphene-like nanocarbon; Combustion synthesis, optical properties; High resolutions electron microscopy; Scanning probe techniques;
Corrosion, wear and wear–corrosion behavior of graphite-like a-C:H films deposited on bare and nitrided titanium alloy
Keywords: تکنیک های پروب اسکن; Diamond-like carbon; Tribology; Corrosion; Scanning probe techniques
Fabrication of fullerene nanoring on an oxidized HOPG surface
Keywords: تکنیک های پروب اسکن; Fullerenes; Scanning probe techniques; Molecular beam epitaxy (MBE)
Heterogeneous oxidation of Si(1 1 1) 7 Ã 7 monitored with Kelvin probe force microscopy
Keywords: تکنیک های پروب اسکن; Silicon; Oxygen; Kelvin probe force microscopy; Atomic force microscopy; Scanning probe techniques; Work function measurements;
Carboxylation treatment of multiwalled carbon nanotubes monitored by infrared and ultraviolet spectroscopies and scanning probe microscopy
Keywords: تکنیک های پروب اسکن; Multiwalled carbon nanotubes (MWCNTs); Chemical treatment; Scanning probe techniques; Spectrophotometry; Characterization
Scanning tunneling microscopy of surface-adsorbed fullerenes: C60, C70, and C84
Keywords: تکنیک های پروب اسکن; Scanning tunneling microscopy; Scanning probe techniques; Physical adsorption; Surface diffusion; Gold; Fullerenes;
Nanoscale imaging of surface piezoresponse on GaN epitaxial layers
Keywords: تکنیک های پروب اسکن; 77.84.Bw; 68.37.Ps; 68.47.Fg; 61.72.Qq; 81.05.Ea; Gallium nitride; Molecular beam epitaxy; Scanning probe techniques; Piezoresponse;
Metastable precursor for oxygen dissociation on Si(0 0 1) 2 Ã 1 resolved by high lateral resolution work function measurements
Keywords: تکنیک های پروب اسکن; Silicon; Oxygen; Kelvin probe force microscopy; Atomic force microscopy; Scanning probe techniques; Work function measurements;
Improved Schottky contacts to annealed 4H-SiC using a protective carbon cap: Investigated using current voltage measurements and atomic force microscopy
Keywords: تکنیک های پروب اسکن; Silicon carbide (SiC); Electrical properties characterization; Scanning probe techniques; Schottky diodes
Novel mesoscale defect structure on NiO(1 0 0) surfaces by atomic force microscopy
Keywords: تکنیک های پروب اسکن; Nickel oxide; Scanning probe techniques; Surface structure; Surface morphology; Topography;
An atomic force microscopy study of the effects of surface treatments of diamond films produced by chemical vapor deposition
Keywords: تکنیک های پروب اسکن; Diamond film; Chemical vapor deposition; Scanning probe techniques; Morphology
Control of surface properties of self-assembled monolayers by tuning the degree of molecular asymmetry
Keywords: تکنیک های پروب اسکن; Self-assembly; Asymmetric dialkyldisulfide derivatives; Scanning probe techniques; Chemical force microscopy; Wetting; X-ray photoelectron spectroscopy; Infrared reflection absorption spectroscopy;
Relationship between the surface morphology and the height distribution curve in thermal evaporated Au thin films
Keywords: تکنیک های پروب اسکن; Surface structure; Morphology; Roughness and topography; Gold; Polycrystalline thin films; Columnar growth; Scanning probe techniques;
Growth and physical properties of individual single-walled carbon nanotubes
Keywords: تکنیک های پروب اسکن; Nanotubes; Chemical vapor deposition; Scanning probe techniques; Vibrational properties;
Ultrathin continuous undoped diamond films: Investigation of nanoscale conduction properties
Keywords: تکنیک های پروب اسکن; Diamond film; Electrical conductivity; Scanning probe techniques; Electrical properties characterization;
Low voltage electrodeposition of CNx films and study of the effect of the deposition voltage on bonding configurations
Keywords: تکنیک های پروب اسکن; Carbon nitride; Vibrational properties characterization; Scanning probe techniques;
Deposition of copper into thin ice buffer layers on MgO(1Â 0Â 0) produces uniform and sinter-resistant nanoparticles
Keywords: تکنیک های پروب اسکن; Scanning probe techniques; Nucleation; Sintering; Magnesium oxide; Copper; Water; Nanostructures;