کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9594942 | 1507978 | 2005 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of locally modified diamond surface using Kelvin probe force microscope
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
شیمی
شیمی تئوریک و عملی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Characterization of locally modified diamond surface using Kelvin probe force microscope Characterization of locally modified diamond surface using Kelvin probe force microscope](/preview/png/9594942.png)
چکیده انگلیسی
The surface potential difference between an H-terminated surface and a locally oxidized diamond surface produced by an atomic force microprobe was investigated using a Kelvin probe force microscope. The potential of the H-terminated diamond surface was observed to be â¼0.1Â V higher than that of the oxidized diamond surface. The surface potential difference can be interpreted in terms of the positions of the vacuum level, the Fermi level, and the conduction and valence band edges, when negative electron affinity and p-type surface conduction are assumed on the H-terminated diamond surface. The surface dipole induced by the electronegativity differences between the surface atoms of the diamond affects the difference in the surface potential between the two surfaces.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Surface Science - Volume 581, Issues 2â3, 1 May 2005, Pages 207-212
Journal: Surface Science - Volume 581, Issues 2â3, 1 May 2005, Pages 207-212
نویسندگان
Minoru Tachiki, Yu Kaibara, Yu Sumikawa, Masatsugu Shigeno, Hirohumi Kanazawa, Tokishige Banno, Kwang Soup Song, Hitoshi Umezawa, Hiroshi Kawarada,