Characterization of multilayered glitter particles using synchrotron FT-IR microscopy

Multilayered glitter particles were cut with a microtome into thin cross-sections and examined using an FT-IR microscope with a synchrotron infrared source. The high brightness of the synchrotron source enabled high-quality infrared spectra to be quickly obtained from individual layers in the glitter particle cross-section, providing additional chemical information that could increase the glitter particle's value as associative evidence in criminal cases.