Origin of Coulomb blockade oscillations in single-electron transistors fabricated with granulated Cr/Cr2O3 resistive microstrips

The purpose of our work is to evaluate single-electron devices fabricated using resistive microstrips and to investigate its applicability for single-electron logic. In this article, we present our work on the fabrication and characterization of SETs with gold islands and CrOx resistive microstrips. The electron transport mechanism of CrOx resistors is also discussed and hypothesis of two types of possible junctions are given as the explanation for the experimental results.