کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9672136 1450564 2005 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Issues in electromagnetic compatibility of integrated circuits: emission and susceptibility
چکیده انگلیسی
This paper is focused on the electromagnetic compatibility (EMC) of integrated circuits. The introduction gives general keyword definitions and principles for emission and susceptibility. The second part deals with the evolution of integrated circuit design and technology with its consequences on EMC. The third part describes the mechanisms for generating parasitic noise within integrated circuits and the role of the package and on-chip supply network. Next, the standardized measurement methods are described for both parasitic emission characterization (conducted and radiated) and immunity from 1 MHz to 1 GHz. Issues and proposals up to 18 GHz are discussed. The advances in modeling of emission are also addressed, as well as the issues in immunity prediction.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 45, Issues 9–11, September–November 2005, Pages 1277-1284
نویسندگان
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