کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9672192 | 1450564 | 2005 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Image alignment for 3D reconstruction in a SEM
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
In a previous paper [1] a procedure to extract the third dimension from back-scattered electron has been proposed. The 3D recovery process involves the acquisition of four images and the computation of surface gradients; thus, a specific algorithm finds the depth map of the given surface. The image acquisition process may require or specific instrumentation (4-sector, independent channel axial BS detector), or very standard SEM configuration and specimen rotation/translation. In this last case an alignment procedure should be developed, which results troublesome because of the different image shadowing. The paper deals with an alignment method based on the parallel acquisition of the BS images and of their respective uniformly shaded twins obtained by the specimen current detector, or by the standard annular axial BS detector.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 45, Issues 9â11, SeptemberâNovember 2005, Pages 1581-1584
Journal: Microelectronics Reliability - Volume 45, Issues 9â11, SeptemberâNovember 2005, Pages 1581-1584
نویسندگان
Ruggero Pintus, Simona Podda, Massimo Vanzi,