کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9775310 1509193 2005 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Defect passivation in strain engineered InAs/(InGa)As quantum dots
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد بیومتریال
پیش نمایش صفحه اول مقاله
Defect passivation in strain engineered InAs/(InGa)As quantum dots
چکیده انگلیسی
A series of InAs quantum dots (QDs) embedded in InxGa1 − xAs confining layers with different In composition and thickness have been investigated by photoluminescence. An enhancement of the PL signal up to 25 times was obtained via hydrogen irradiation. It has been shown that two different non radiative channels account for the temperature dependence of the PL spectra in both as-grown and hydrogenated samples. In the latter samples, only a partial passivation of both type of defects, whose nature is discussed, has been achieved.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science and Engineering: C - Volume 25, Issues 5–8, December 2005, Pages 830-834
نویسندگان
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