Capacitive of characteristics of manganese oxides and polyaniline composite thin film deposited on porous carbon

The manganese oxides and polyaniline composite thin film was chemically deposited on porous carbon electrode through oxidizing aniline thin film by a KMnO4 solution. The capacitance and stability of this composite film were investigated by cyclic voltammetry (CV). The redox properties of the MnO2-polyaniline (M-P) thin film exhibited ideal capacitive behavior in a 0.1 M Na2SO4 solution. The capacitance of M-P film materials can reach 500 F g−1 and maintains about 60% of the initial capacitance after 5000 cycles. The structure and surface morphology of M-P film were examined in terms of the X-ray diffraction patterns (XRD) and scanning electron microscopic (SEM) photographs. The composition of M-P film was also studied by X-ray photoelectrons (XPS).