کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9785516 | 1512645 | 2005 | 13 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Scanning near-field optical microscopy of metallic features
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
A numerical method has been used to model images acquired from a scanning near-field optical microscope (SNOM) operating in illumination mode. Results are presented for samples consisting of small metallic features (strips, slots, islands) deposited onto a silica substrate. As anticipated, the model microscope is capable of resolving features that are almost arbitrarily small (â¼15Â nm), however, it is found that the appearance of the modelled images is dependent on the conditions under which the image is captured and can show such counter-intuitive effects as 'contrast inversion' in which small metallic features appear as bright regions on the collected image. The results are contrasted with those from earlier studies which focussed mainly on dielectric structures.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Optics Communications - Volume 256, Issues 4â6, 15 December 2005, Pages 476-488
Journal: Optics Communications - Volume 256, Issues 4â6, 15 December 2005, Pages 476-488
نویسندگان
S.H. Simpson, S. Hanna,