Nonlinear refraction measurements in presence of nonlinear absorption using phase object in a 4f system

We report a technique to measure the value of the nonlinear refractive index of materials in presence of nonlinear absorption using a phase object at the entry of a 4f coherent imaging system. We show that it is possible to obtain a signal approximately due only to the induced nonlinear refraction in presence of two photon absorption. Experimental and simulated Z-scan transmittance profiles with and without phase object, as well as acquired and calculated images are presented here in order to validate our approach. We show also that the use of a reference material simplifies the measurement procedure avoiding computer fits.