Quantitative analysis of photoinduced phenomena in amorphous As2S3 thin films using the scanning homodyne multiport interferometer

Photoinduced effects in amorphous As2S3 thin films have been studied quantitatively using the scanning homodyne multiport interferometer which was designed for mapping local phase and reflectance variations. From the experimental results, we have been able to evaluate quantitatively photodarkening effect, giant photoexpansion, and photoinduced index-grating formation in amorphous As2S3 thin films.